Testing Reliability Equivalence Factors of a Series-Parallel Systems in Burr Type X Distribution

In reliability analysis for improving the system performance, the scale parameter of the life time model has mainly considered to obtain equivalence factors for the system designs. In this paper, we propose a new approach through modifying the shape parameter of the Burr type X distribution. The proposed approach is applied to the general series parallel systems. Three different methods are used to improve the system reliability: (i) the reduction method, (ii) the hot duplication method and (iii) the cold duplication method. Numerical example is presented to compare performance of the applied methods, to find limitations for the equivalence factors and to illustrate the overall theoretical analysis.